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2014 ANNUAL REPORT 109 The experiments were conducted at temperatures of 30C and 500C.The damage profile as calculated from Stopping and Range of Atoms in Matter SRIM is shown in Figure 1. The irradiated samples were then prepared forTEM studies using a focused ion beam - scanning electron microscope FIB-SEM Quanta 3D field emission gun FEG in the CAES MaCS facility. Ms. Jatu Burns assisted graduate student Sultan Alsagabi in this effort. The FIB-SEM procedure started with protecting the irradiated surface with a platinum Pt deposition layer. Figure 2 shows the specimen after irradiation. For detailed microstructural charac- terization aTF30 FEG scanningTEM STEM was utilized operating at an accelerating voltage of 300 kV.The FIB samples were attached to a copper grid before examination inside the TEM.The dislocation density of the prepared samples was estimated while they were oriented in a two-beam condition and the electron energy loss spectrum EELS technique was applied to measure sample thickness. TEM images of the irradiated samples were obtained from the irradiated area of the FIB sample. Samples from the unirradiated area were also examined for comparison purposes. Graduate student Alsagabi completed this task with the assistance of Dr.Yaqiao Wu of the CAES MaCS staff. The irradiation-induced damage evolution in the samples at 30C as a function of damage dose dpa is shown in Figure 3.The irradiated samples did not show any distinct irradiation-induced precipitates dislo- cation loops or voids. However they do show the presence of irradiation- Figure 2. The FIB sample showing the Pt-deposited layer irradiated and unirradiated areas.