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2014 ANNUAL REPORT 61 Figure 4 a Brightfield high resolution transmission electron microscopy HRTEM micrograph of an edge on grain of a MITR-Ti2AlC sample irradiated to 0.1 dpa at 360C reveals perturbation of the basal planes and the presence of defect clusters andor black spots circled. b TEM micrograph of a MITR-Ti2AlC sample irradiated to 0.4 dpa at 360C taken in 2 beam condition near the 0001 zone axis shows a higher density of small black spots circled. c Brightfield TEM micrograph of a fine-grained MITR-Ti3SiC2 sample irradiated to 0.1 dpa at 695C shows dislocation loops imaged near the 11 -20 zone axis parallel to the basal plane agglomerating near a stacking fault black arrow.The loops are seen as black and white lobes due to strain induced in the surrounding lattice with an average defect density of 3.94 x 1021 loopsm3. d Brightfield TEM micrographs of MITR-Ti2AlC irradiated to 0.1 dpa at 695C taken near the 11 -20 zone axis reveal dislocation loops edge on within the basal planes with a higher average density of 1.1 x 1023 loopsm 3 .